Product
Resistance & Thickness
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Probe Station
AFM & DLTS
Sheet Resistance Measurement
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Liquid Crystal Resistivity
Spectral Optical Spectrometer
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Probe Station
AFM
Metallomicroscope
Deep Level Transient Spectrum Test
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Cn
Tn
Product
Resistance & Thickness
Sheet Resistance Measurement
Thickness & Flatness
Liquid Crystal Resistivity
Spectral Optical Spectrometer
Spectral Optical Spectrometer
Probe Station
VCSEL Application
Probe Station
AFM & DLTS
AFM
Metallomicroscope
Deep Level Transient Spectrum Test
Support
Application Notes
Catalog
Technical Support
Cooperation
About Us
About Us
Company News
Exhibition Information
Join Us
Contact Us
化合物半导体
半导体
化合物半导体
测试与测量
工程材料
衬底及外延片材料特性测试
衬底及外延片材料特性测试
芯片制程及封装应用
霍尔效应
霍尔效应
电化学CV
荧光光谱仪/电致发光
外延层厚度测量
非接触式面电阻/超高阻测量
表面缺陷及形貌扫描
深能级瞬态谱测试
